The right Sensor at the right time

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Adept is currently pursuing a patent portfolio based on Intellectual Property developed in-house in the field of CMOS Image Sensor Design and Manufacture.

Highly linear, stray independent CMOS photo-pixel with low noise, low cross-talk, high dynamic range and high common mode noise immunity
Low power Analog to Digital Conversion architecture with resolution up to 14 bits
Column buffer that eliminates both threshold offsets (FPN) and gain non-uniformity (PRNU)
High speed high dynamic range fully differential amplifier architecture
Method of digital library design for low noise operation in a mixed signal environment

In the course of working with clients, some novel developments were patented.

Below is a list of patents currently on record.

   Number        Date Granted    Name  

 
US06072224 06/06/2000 Monolithic x-ray image detector and method of manufacturing
US05886353 03/23/1999 Imaging device
US05798558 08/25/1998 Monolithic x-ray image detector and method of manufacturing
US05619040 04/08/1997 Data acquisition system
US05528043 06/18/1996 X-ray image sensor
 

 

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Last modified: June 18, 2001